Agilent ICP-OES 5110 User Guide (2024)

  • Manual =Information
    • Author(s):=a>
  • P=urpose a300pxnd Audience
  • Special Tha=nks
  • Introduction and Theory of Operation
  • Safe=ty Considerations
  • In This U=ser Guide
  • Apparatus, Reagents and Materials
    • Hardware=li>
    • Consumables=
    • Reagents=li>
  • Methods for Preparation of Standards
    • Preparing Interstitial Water Standards
      • Preparing Reagents at the Start of Expedition
      • Preparing the Calibration Standards
      • Preparing and Measuring Major Cation Salt Solutio=ns:
      • Preparing Interstitial Water Working Standards:<=/li>
    • Alternate Method for Interstitial Water Standards=
    • Preparing Hard Rock and Sediment Standards:
  • Methods for Preparation of Samples
    • Interstitial Water (Waters Method)
    • Hard Rock and Sediment (Solids Method)
    • Preparing an Analytical Sequence
  • Performing an ICP-OES Analysis
    • S=tarting the Instrument
    • Selecting Elements, Wavelengths and Int=ernal Standards to Measure
    • Specifying Instrument Measurement Conditions
    • Creating a Sample Sequence
    • Starting and Monitoring a Run
    • Exporting, Vetting and Uploading Data
  • Post-Run Shutdown and Cleanup
    • Instrument Shutdown Procedure
    • Cleaning Instrument Components:
  • Data =Available in LORE
  • Quality Assurance/Quality Control and Data Reduction=
    • =Sediment/Rock Standards
  • Troublesh=ooting
  • Steps Going Forward for Method Improvement:
  • References=
  • App=endix 1: List of Instrument Measurement Parameters, Element Wavelengths and= Internal Standard Wavelengths
    • Interstitial Waters Method:
    • Element Wavelengths Excluded fro=m the Interstitial Waters Analysis and Why
    • Hardrock and Sediments Method
    • Element Wavelengths Excluded from the Hard=rock Analysis and Why
  • Appendix 4: Table of Values= for Hard Rock and Sediment Certified Reference Materials
  • LIMS C=omponent Table
  • Archive V=ersions

Author(s):

=td>

V. Percuoco, D. Houpt

Reviewer(s):

Revised by:

Management Approval:

Revised:

376 | March 2018

Previous Versions:

V1.1 | 6 Jan 2014 (IODP-II), V1.0 | 7 August 2013

Domain:

Chemistry

System:

ICP-AES Elemental Analysis

Keywords:

ICP, dissolved metals

Agilent ICP-OES 5110 User Guide (1)

This user guide is intended for use by scientists and technical staf=f who have laboratory experience with analytical instrumentation, preparing= standards and samples, and data reduction; who have received an introducti=on and demonstration of the laboratory instrumentation aboard the JOIDES Re=solution. Good laboratory practices and attention to laboratory safety are =necessary while performing the procedures outlined in this user guide.
<=br> The user guide is to be used in conjunction with the Agil=ent 5100 and 5110 ICP-OES User=E2=80=99s Guide and the ICP Expert Help, both of which provide clear, detailed =walkthroughs of instrument setup, operation, maintenance and troubleshootin=g procedures. Brief procedural videos are accessible through IC=P Expert Help which demonstrate proper techniques when dealin=g with instrument components. The Agilent For Your Safety User==E2=80=99s Guide details additional safety information. Becom=e acquainted with these resources before proceeding through this user guide=.


The JRSO wishes to thank Raymond M. Johnston and Jeff Ryan for their =help and advice in fleshing out the solids methodology in this User Guide, =as originally presented in the Exp. 366 IODP Proceedings Methods chapter. T=he JRSO also thanks Hans Brumsack for refining the interstitial water metho=dology as described on the Exp. 369 IODP Proceedings Methods chapter. The J=RSO also thanks all of the many other geochemists who have provided help an=d advice over the many years of elemental analysis on the JOIDES Resolution=.

Inductively-coupled plasma optical emission spectrometry is a techni=que used to measure the elemental composition of a material by evaluating c=haracteristic elemental spectra emitted during plasma heating. Dissolved sa=mple flows through an introduction system in which the component molecules =are desolvated, atomized and excited within an argon plasma. The transfer o=f energy from electronic and atomic collisions within the plasma excites el=emental valence electrons across various atomic and ionic orbitals, which i=n turn release characteristic photons during electron de-excitation. Portio=ns of these photons are directed through an optical chamber and ultimately =fall upon a diffraction grating where they are reflected at angles determin=ed by their wavelengths, separating them, like a prism, into discrete spect=ral orders. The photons impinge on an accurately aligned CCD or CMOS detect=or chip, and thus are mapped to a 2-D pixel array. A given element concentr=ation is determined by locating its spectra within the array (i.e. on the c=hip), integrating the spectral intensity over a short time interval and com=paring the results against a calibration curve of certified reference mater=ial.

The Agilent 5110 ICP-OES is used for routine shipboard measurement o=f interstitial water and hard rock matrices. The Waters method allows for s=imultaneous determination of major and minor dissolved elements. The Hard R=ock method yields elements making up the major oxides, minor elements, and =several trace metals that surpass the limits of detection. ICP-OES analytic=al results are heavily matrix dependent, thus the suite of elemental analyt=es may be altered on a per expedition basis depending upon the material col=lected.

Before conducting an analysis for the first time, consult the Agilen=t Technologies Agilent 5100 and 5110 ICP-OES User=E2=80=99s Gui=de and For Your Safety =User=E2=80=99s Guide for a detailed review of safety issues. =Listed below is a succinct overview of several important safety issues whic=h are flagged, when appropriate, within the text:

  • Ensure there is adequate storage space and ventilation for high-pr=essure argon gas bottles. Bottles must be secured to a rack, and the racks =must be secured to the ship. The steel cap for each bottle must be in place= whenever the bottles are not connected to the gas manifold. Use Swagelok S=noop Liquid Leak Detector to ensure proper seals at argon bottle and gas ma=nifold connections.
  • Samples and standards are made up in dilute solutions of concentra=ted nitric acid. Use proper PPE (nitrile gloves and eye protection) when ha=ndling acids. Always add acid to water. Be aware of the location of acid sp=ill control and neutralization kits.
  • Ensure the fume hood ventilation above the instrument is operation=al before igniting the plasma.
  • The plasma torch is extremely hot during operation (6000 K). Do no=t handle the torch, RF coil, or other items within the torch compartment un=til ample time (>5 mins) has been given for the glassware to cool after =operation. Wear heat resistant gloves if necessary.

The plasma emits ultraviolet and intense visible light. Ensure the t=orch compartment door is closed and sealed whenever igniting the plasma. In=strument safety interlocks will extinguish the plasma If the door is opened= during operation, however, do not attempt to open the door while the plasm=a is active.

  • Empty the waste container of acid residue after every batch analys=is.

Agilent ICP-OES 5110 User Guide (2)=span>

Hardware

The complete Agilent 5110 ICP-OES system includes:

  • Agilent 5110 Single View/Dual-View (SVDV) ICP-OES system equipped =with the Automatic Valve Switching (AVS 6/7) option
  • Agilent SPS4 4-rack autosampler
  • Agilent G8481A Recirculating Chiller
  • Mettler Toledo XS204 motion-compensated dual balance system
  • Cahn Microbalance motion-compensated dual balance system
  • Barnstead Reverse Osmosis Water Purification System
  • Burrell Wrist-Action Shaker
  • Thermolyne Muffle Furnace

Consumables

Reagents

  • Reagent Water: 18 M=CE=A9 deionized water
  • Sodium Chloride: Trace metal clean
  • Nitric Acid (HNO3): Trace metal grade,= 70% concentrated. Warning: Always add acid to water.
  • Element Stock Solutions: Certified 1000 ppm: Al, =Ba, Ca, Co, Cr, Cu, Fe, Ge, K, Mg, Mn, Na, Nb, Ni, P, Sc, Si, Sr, Ti, V, Y,= Zn, Zr
  • Element Internal Standards: Certified 1000 ppm: B=e, In, Sb, Sc, Y
  • Argon Gas: Ultra high purity (UHP) grade
  • IAPSO standard seawater is produced to have a spe=cific conductivity, K15, referenced to a known concentration of =KCl at 15=C2=B0C. It has been shown by Bacon et al. (2007) to be extremely =consistent and stable over a reasonable period of time. It is assumed withi=n this method that the concentration of the constituents in IAPSO s=tandard seawater is, for all intents and purposes, the same as tha=t of standard reference seawater. Using the numbers found in Millero (2008)=, substituting the averaged value for Gieskes (1991) and Summerhayes (1996)= for lithium and alkalinity, the working concentrations are therefore:
    <=br>

Constituent1

=td>

Concentration2

=

Concentration3

=

Concentration4

=

Concentration5

=

Working Concentrations

Lithium (=C2=B5M)

27

25.7

N/A

N/A

26.4

Sodium (mM)

480

480.2

480.2

480.7

480.7

Potassium (mM)

10.44

10.46

10.46

10.46

10.46

Magnesium (mM)

54

54.4

54.1

54.1

54.1

Calcium (mM)

10.55

10.54

10.54

10.54

10.54

Strontium (=C2=B5M)

87

92

92.8

93.0

93.0

Chlorine (mM)

559

559.6

559.4

559.6

559.6

Sulfate (mM)

28.9

N/A

28.9

28.94

28.94

Alkalinity (mM)

2.325

N/A

2.38

N/A

2.353

1. The molarity values in this table except for Gieskes et al. (1991=) were calculated from the g/kg values in the reference using the density o=f standard seawater at 15=C2=B0C (1.025 kg/L) in order to match the standar=dized K15 value for IAPSO seawater. 2. Gieskes et al. (1991) alr=eady given in terms of molarity. 3. Summerhayes et al. (1996); also quoted =by the OSIL website as their reference for IAPSO constituents. 4. Pilson (1=998). 5. Millero et al. (2008). N/A =3D not available from this author.

Preparing Interstitial Water Standards

Preparing Reagents at the Start of Expedition

Prepare the following reagents at the beginning of an expedition an=d afterwards on an as-needed basis. For the relevant reagents listed below,= the lithium carbonate (Li2CO3) is an optional additi=on.

  • Internal Standards:=20
    • Interstitial Waters: 100 ppm Be, In, Sc, 200 p=pm Sb: Add 10 mL of each Be, In, Sc and 20 mL Sb elemental reference standa=rds (1000 ppm) to a 100 mL volumetric flask, make up with 2% trace metal cl=ean nitric acid. 100 mL is enough for 1000 samples
    • Hardrock/Sediment: Same as the interstitial wa=ters internal standard except no scandium (Sc) is added as it is present in= rock/sediment matrices.
    • Acidified Synthetic Seawater: 35 g trace metal= clean NaCl + 29 mL concentratedtrace metal HNO3 made up t=o 1 L with MQ water.
    • Nitric Acid Solutions: Add 14.3 mL of concentr=ated trace metal HNO3 per 1 L of MQ water for each percentage po=int increase in concentration of acid solution (v/v), e.g. 1% HNO3: 14.3 mL, 2%: 28.6 mL, 3%: 43 mL HNO3. Warning: Alway=s add acid to water.
      • Rinse Solutions: Make 5-10 L at a time.=20
        • Interstitial waters: 3% nitric(Use t=race metal nitric acid)
        • Hardrock/sediment: 10% nitric (Use trace m=etal nitric acid)
  • Matrix:
    • Interstitial waters: 2% trace metal nitric
    • Hardrock/sediment: 10% trace metal nitric, Optional: 53.25 g of ultrapure Li2CO3 may be ad=ded as an ionization buffer. Ensure the Li2CO3 is ful=ly dissolved

=Preparing the Calibration Standards

The calibration standards follow a matrix-matched internal standard =approach that spans the range of expected concentrations of the pore water =analytes. The recipe may need to be adjusted on a case-by-case basis. For t=he Interstitial Waters Method, two batches of standards must be prepared=E2==80=94a serial dilution of an in-house elemental co*cktail and a serial dilu=tion of IAPSO Seawater.

Agilent ICP-OES 5110 User Guide (3)

Preparing and Measuring Major Cation Salt Solutions:

Frequently, dissolved major cations increasing downhole surpass the =upper bound of IAPSO concentrations and the certified 1000 ppm standards at= working dilutions. These elements may be constrained within calibration cu=rves by increasing the dynamic range of the calibration solutions with majo=r cation salt doping. Primary salt solutions are prepared and concentration=s are determined by ICP once at the beginning of an expedition and carried =through further standard co*cktails. There is no need to heat salts in the o=ven to desiccate. Note: magnesium chloride hexahydrate dec=omposes to magnesium tetrahydrate at 116.6=C2=B0C:

  • 1% Potassium: Make up 1.94 g of potassium chlorid=e (KCl, 74.5513 g/mol) in 100 mL MQ water
  • 1% Magnesium: Make up 9.13 g of magnesium chlorid=e hexahydrate (MgCl2H12O6, 203.31 g/mol) i=n 100 mL MQ water
  • 1% Calcium: Make up 3.8 g of calcium chloride dih=ydrate ( CaCl2H4O2, 147.008 g/mol) in 100 =mL MQ water
  • 3.5% NaCl: Acidified Synthetic Seawater reagent=li>

Measure each solution against certified reference standards to acqui=re accurate concentrations for further standard dilutions.

  • Working salt solutions: Pipette 1 mL of each 1% K=, Mg, and Ca salt solution, and 286 =C2=B5L of 3.5% NaCL into a single 100 =mL volumetric flask and make up with 2% trace metal HNO3. With t=his solution, prepare 5-7 replicates of a 1:10 dilution (1 mL solution + 9 =mL 2% HNO3) to be run by ICP. Vortex mix the aliquots. Each yiel=ds roughly a 10 ppm solution containing each major cation.
  • Primary Certified Standard: Pipette 5 mL of each =the 1000 ppm Ca, K, Mg, and Na standards into a 50 mL volumetric flask and =make up with 2% trace metal HNO3.

Make up 6 calibration standards according to the following scheme:=p>

Standard conc. (ppm)

Volume Primary Certified Standard (=C2==B5L)

Volume 2% trace metal HNO3 =(mL)

Blank

10

4 ppm

400

9.6

8 ppm

800

9.2

12 ppm

1200

8.8

16 ppm

1600

8.4

20 ppm

2000

8.0

Use the template IODP_STANDARD_SALTSOLUTIONS_TEMPLATE to evaluate the 5-7 replicates against the above calibration st=andards. For each wavelength used, average the concentrations for the 5-7 r=eplicates. Multiply the Ca, K, and Mg concentrations by a factor of 1000, a=nd Na by a factor of 3500 to give the original 1% salt concentrations in pp=m. In judging each element=E2=80=99s concentration, average all samples acr=oss all wavelengths after removing any erroneous/problematic lines. To star=t this analysis follow the steps given in Performing an ICP-OES= Analysis. Adjust and update the concentrations of Na, Mg, Ca=, and K listed in Table 1 to reflect the values m=easured in the 1% salt solutions.

Preparing Interstitial Water Working Standards:

Prepare a primary co*cktail standard according to the recipe shown in= columns 2 and 3 of Table 1. Pipette all individu=al standards into a single 100 mL volumetric flask and bring to volume with= 2% trace metal HNO3. Na, Mg, Ca, and K values are from the majo=r salt solutions which are determined in the preceding step, the remaining =standards are 1000 ppm SPEX CertiPrep reference standards.

Table 1: Recipes of the primary co*cktail and IAPSO =(highlighted in blue) used to create working standards, and final concentra=tions of the working standards. Serially dilute the in-house co*cktail and I=APSO according to the scheme given in Table 2. Na, Mg, Ca, and K are from t=he major salt solutions. Adjust concentrations accordingly. Iron and mangan=ese values were excluded from IAPSO due to their low concentrations, and ba=rium due to its precipitation with sulfate. Be wary of silicon concentratio=ns in IAPSO due to its storage in glass containers.

Final Concentrations of In-House Worki=ng Standards (uM)

Element

Primary CRM (ppm)

Volume (mL)

co*cktail (ppm)

200 %

100 %

75 %

50 %

25 %

10 %

5 %

1 %

0 %

B

1000

3 30 5550 2775 2081 1387 693.7 277.5 138.7 27.75 0

Ba

1000

5 50 728.2 364.1 273.1 182.0 91.02 36.41 18.20 3.641 0

Fe

1000

0.5 5 179.1 89.5 67.15 44.77 22.38 8.953 4.477 0.8953 0

Li

1000

0.5 5 1441 720.4 540.3 360.2 180.1 72.04 36.02 7.204 0

Mn

1000

0.5 5 182.0 91.01 68.26 45.51 22.75 9.101 4.551 0.9101 0

P

1000

0.5 5 322.9 161.4 121.1 80.71 40.36 16.14 8.071 1.614 0

Si

1000

2.5 25 1780 890.1 667.6 445.1 222.5 89.01 44.51 8.901 0

Sr

1000

5 50 1141 570.6 428.0 285.3 142.7 57.06 28.53 5.706 0

Na

~13000

62








0

Mg

~10000

12 1200 98745 49373 37029 24686 12343 4937 2469 493.7 0

Ca

~10000

4.5 450 22456 11228 8421 5614 2807 1123 561.4 112.3 0

K

~10000

4 400 20461 10231 7673 5115 2558 1023 511.5 102.3 0

Final Concentrations of IAPSO Working =Standards (mM)

Element

IAPSO (ppm)



200 %

100 %

75 %

50 %

25 %

10 %

5 %

1 %

0 %

Na 10760

961.4 480.7 360.5 240.3 120.2 48.07 24.03 4.807 0
Mg 1293

108.3 54.14 40.60 27.07 13.53 5.414 2.707 0.5414 0
Ca 413

21.08 10.54 7.906 5.271 2.635 1.054 0.5271 0.1054 0
K 399

20.93 10.46 7.847 5.231 2.616 1.046 0.5231 0.1046 0
S 904

57.88 28.94 21.71 14.47 7.24 2.89 1.45 0.29 0
Sr 7.89

0.18 0.09 0.07 0.05 0.02 0.01 0 0 0
Li 0.202

0.06 0.03 0.02 0.01 0.01 0 0 0 0
P 0.07

0 0 0 0 0 0 0 0 0
Si 2.8

0.2 0.1 0.07 0.05 0.02 0.01 0 0 0
B 4.5

0.83 0.42 0.31 0.21 0.1 0.04 0.02 0 0

As listed in Table 2, create one set of working standards by making serial dilutions of the= in-house synthetic co*cktail (Table 1) using sepa=rate 100 mL volumetric flasks, adding the required amount of 3.5% sodium ch=loride, 100 ppm internal standard and bringing to volume with 2% trace meta=l HNO3. Prepare a set of IAPSO serial dilutions in the same fash=ion (do not add 3.5% sodium chloride). Note: Both sets of =standards are analyzed in order to constrain Ba and S (predominately SO42-) which precipitate if present in the same vial (even =if acidified), and to measure Na=E2=80=94which is necessarily kept constant= to be used as an ionization buffer for the minor elements in the synthetic= standards.

Table 2: Recipes for two sets of standard serial di=lutions, one of the synthetic standard co*cktail and the other of IAPSO. Pre=pare each standard in a 10 mL nalgene bottle, make up to volume with 2% tra=ce metal nitric acid for IAPSO standards, and make up to volume with acidif=ied synthetic seawater for In-House working standards. The final concentrat=ions are listed in Table 1. Note: The left three columns indicate the recip=e for the 10 ml In-House working standards and the three columns to the rig=hts are the 10 ml IAPSO standards recipe.

In-House Working Standard Name

Volume In-House co*cktail (mL)=

Volume Acidified 3.5%= Seawater (mL)

Volume 100 ppm

Internal Standard (mL)

IAPSO

Working Standards

Volume
IAPSO (mL)

Volume 100 ppm Internal STD=p>

0%

10

2

0%

2

1%

0.1

9.9

2

1%

0.1

2

5%

0.5

9.5

2

5%

0.5

2

10%

1

9

2

10%

1

2

25%

2.5

7.5

2

25%

2.5

2

50%

5

5

2

50%

5

2

75%

7.5

2.5

2

75%

7.5

2

100%

10

2

100%

10

2

200% 20 0 2 200% 20 2

Alternate Method for Interstitial Water Standards

The aim of this method of preparing standards is to reduce error. In=stead of standards and samples being prepared differently for analysis, the=y will all be prepared the same. In addition there will only be two solutio=ns being pipetted for sample dilutions instead of three. This method also m=imics prior methods used with the previous ICP where large batches of a mat=rix solution were made. Internal standard amounts were selected to remain c=lose to the concentrations used in the above preparations.

  • Matrix Solution: Pipette 2.25mL each of Be, In, S=c, and 4.5 mL Sb, along with 28.3 mL trace metal HNO3 to 1L of nanopure wat=er.
In-House Working Standard Volume In-House co*cktail (mL) Volume Acidified 3.5% Seawater (mL) IAPSO Working Standards Volume IAPSO (mL) Volume 2% trace metal HNO3 (mL)



Acid Blank 0 10
1% .1 9.9 1% .1 9.9
5% .5 9.5 5% .5 9.5

10%

1 9 10% 1 9
25% 2.5 7.5 25% 2.5 7.5
50% 5 5 50% 5 5
75% 7.5 2.5 75% 7.5 2.5
100% 10 0 100% 10 0

Preparing Hard Rock and Sediment Standards:

Hard rock and sediment standards are prepared according to the ICP-OES Hard Rock Preparation User Guide. Standards ar=e fused with lithium metaborate (LiO2) at a 1:4 sample:flux rati=o and then dissolved in a 10% trace metal HNO3 solution (Optiona=l: doped with Li2CO3) for a total dilution factor of =1:2000. Lithium carbonate may be employed as an ionization buffer to mainta=in a relatively constant number of free electrons in the plasma to mitigate= ionization and matrix effects and enhance peaks intensities of minor eleme=nts (not part of the routine analysis).

Major elements are reported in weight % (mass of oxide/mass of sampl=e) of the respective oxide, with iron species being normalized to Fe2<=/sub>O3 (the designation Fe2O3t is used, w=here t =3D total). Minor elements are reported in units of ppm (mass of ele=ment/mass of sample).

An analytical procedural blank= is prepared identically to the samples, with the exception that only 0.4 g= of flux is fused and dissolved. An additional 0.1 g of flux is not added t=o mimic the TDS of the 0.5 g mix of sample + flux because this would provid=e an inaccurate quantitation of the impurities introduced by the amount of =flux used in preparation of the unknowns.

Flu=x-Fusion Preparation of Rocks

Consult the IODP Hard Rock ICP Sample Preparation Guide<=/em> for a complete, in-depth explanation of the hard rock and sed=iment sampling procedure. The amount of time necessary to prepare a single =sample for analysis according to Table 4 is appro=ximately 48 hours.

Table 3: ICP hard rock and sediment sampling and be=ad preparation timeline

Step

Time

Single (S) or Batch (B)

=td>

Cutting the samples to size

5 min

S

Cleaning the samples on the diamond whee=l

5 min

S

Cleaning samples in methanol/DI

30 min

B

Drying samples

12 hr

B

Crushing samples in the X-Press

15 min

S

Grinding samples in the Shatterbox

15 min

3 samples

Determining Loss-On-Ignition (LOI)

20 hrs

B

Making the sample beads

15 min

S

Diluting samples

2 hrs

B

Acid Cleaning Platinum Crucibles

12 hrs

B

Total

48 hrs

B

Dilution =of Sediment/Hard Rock standards

Choose a suite of hard rock or sediment standards which matrix-match= and span the range of expected concentrations within the samples. Consult =Appendix 4: Table of Values for Hard Rock and Sediment Certifie=d Reference Materials when choosing analytic=al standards. Standards are prepared in the same fashion as samples, as des=cribed in the proceeding section (see Hard Rock and Sediment (S=olids Method)).

Characteristics of Flux Fusion Solutions

Flux fusion solutions become unstable over time; major and trace ele=ments precipitate or form a gel, which is not always visible (since it is c=lear), so inspect solutions prior to analysis. The stability of the solutio=n is proportional to the dilution factor and acid content and inversely pro=portional to the SiO2 content. A dilute solution is more stable =than a concentrated one, and a solution becomes more stable with higher HNO=3 presence. A flux-fusion solution enriched in SiO2 i=s likely to be more unstable than a basalt or shale solution. Analyze sampl=es on the ICP shortly after they are dissolved.

I=nterstitial Water (Waters Method)

This method applies to water samples in a 2% nitric acid solution at= a 1:10 (v/v) dilution factor.

  1. Acidify pore water, rhizon or other aqueous samples with 5-10 uL o=f concentrated trace metal grade nitric acid and store refrigerated in seal=ed vials.
  2. When preparing an analytical batch, pipette 500 =C2=B5L of sample =(using an Eppendorf set-volume pipette) + 100 =C2=B5L internal standard + 4=.4 mL of matrix solution into a 15 mL vial. Cap and mix using a vortex stir=rer for 10 seconds.

Hard Rock and Sediment (Solids Method)

This method applies to hard rock and sediment samples in a 10% trace= metal nitric acid solution at a 1:2000 (m/v) dilution factor

  1. Prime the 50 mL dispensette atop a 1 L bottle containing&nbs=p;10% nitric acid solution. Ensure there are no air bubbles present in the spigot.
  2. Add 50 mL of10% nitric acid solutionto a 125 mL HNO3<=/sub>acid-cleaned Nalgene wide-mouthed bottle.
  3. Carefully place the sample bead (and all chipped pieces) in the 12=5 Nalgene bottle, close the lid, and agitate with the Burrell wrist-action =shaker for 1 hr.
  4. Using a new or acid-washed 20 mL syringe, extract solution from th=e sample bottle and then using a 0.45 =C2=B5m Acrodisc syringe filter, filt=er the solution into a 60 mL acid-cleaned Nalgene wide-mouth bottle. Repeat= until the entire sample is filtered.
  5. Pipette 500 =C2=B5L of the filtered solution into a 15 mL scintill=ation vial and dilute it with 100 =C2=B5L hardrock internal standard + 4.4 =mL dissolution solution. Cap and mix using a vortex stirrer for 10 seconds.=
  6. Analyze samples within 48 hours of dilution.

Pre=paring an Analytical Sequence

Correct setup of the analytical sequence is integral to monitoring a=nd troubleshooting the analytical results. Adhere to the following scheme i=n all cases:

  1. Bracket samples and with check standards. Use the 100% Level (IAPS=O and the In-house) standards as checks. Prepare a large volume of the chec=k standards in a volumetric flask and, after mixing, decant it into several= aliquots to be analyzed intermittently every 8-10 samples.
  2. IMPORTANT: Analyze a blank before runnin=g the calibration standards, and periodically throughout a run. The blank m=ust be diluted in the same fashion as the samples. It must contain the same= amount of internal standard. The blank must be analyzed first.
  3. Analyze the standards at the beginning of a sequence. They can be =in a random order.
  4. Always analyze the samples in a random order, do not sequence them= by depth in hole.

Agilent ICP-OES 5110 User Guide (4)

Figure 1: ICP Expert instrument dashboard.

Starting th=e Instrument

  1. Verify that the instrument is connected to the electrical mains (v=oltage requirement: 200 V), and that instrument is connected to the PC and =network via Ethernet.
  2. Verify the Ar line is connected and the wall-mounted pressure gaug=e reads 90 psi. In the Upper Tweens ensure that two Ar gas manifold lines a=re each connected to a series of four Ar bottles. Open the manifold valve t=o only one set of four bottles. A fresh rack yields a pressure of ~2200-240=0 psi=E2=80=94displayed on the pressure gauge connected in-line to the mani=fold above the Ar bottle racks. The regulator should be set around ~400 psi=. The Ar usage is ~100 psi/hour with the plasma on, and ~2.5 psi/hr during =standby. Use the Gas Status Monitor (http://eiger.ship=.iodp.tamu.edu/GASSTATUS/) to monitor gas levels during an analysis. Note: Ar leaks may cause asphyxiation by displacing oxygen. =Notify a coworker when manipulating gas lines in the Upper Tweens.
  3. Open the wall-mounted Ar valve above the ICP workstation.
  4. Power on the instrument by first enabling the kill-switch located =on the rear-left, then press the power button located on the front-left of =the instrument. The LED for the power button will flash green for a few sec=onds before steadying.
  5. Start the ICP Expert software.
  6. Wait approximately 30-45 minutes for the polychromator temperature= to stabilize at 35.0=C2=B0C. The temperature may periodically fluctuate by= 0.1=C2=B0C. If measuring wavelengths below 189 nm it is best to allo=w the polychromator to purge for a total time of 2-3 hours with Boost purge enabled.
  7. Turn on the water chiller. The default temperature setpoint should= be at 20=C2=B0C and the pressure setpoint at 59 psi. Turning on the instru=ment alone does not require the water chiller to be on, but you would want =to have the chiller on for 30 minutes before igniting the plasma. The Pelti=er cooling temperature should be at -40=C2=B0C.
  8. In ICP Expert click the ICP instrument b=utton located on the top tool bar to bring up the instrument parameters men=u. Click Plasma on. Over the next 60 seconds the =plasma will ignite. If the plasma suddenly extinguishes during ignition, it= is usually due to air drawn up through the tubing for the spray chamber ri=nse solution. Repeat this step while covering the end of the tubing with a =gloved finger. The peristaltic pump comes on when the plasma ignites. Once =the plasma is on, place the spray chamber rinse tubing in the 3% TM HNO3 bottle. Allow the plasma to stabilize for more than 20 minutes.
  9. Important: Ensure the peristaltic pump tubing is correctly seated.= Place the tubing collars within the beams located above and below the pump= wheel. Seat the collars within the beam grooves, not stretched along the o=utsides. Allow the pump to turn several times (enabling fast pump helps) fo=r the tubing to work itself into position, then engage the pressure bars an=d if necessary adjust the tension of each. Bands of air or sample flowing t=hrough the lines leading to the pump should be unvarying in speed. If there= is a chugging motion in fluid flow the pressure bars are too tight. If the=re is no flow, the pressure bars are too loose or there is blockage.

Selecting Elements, Wavelengths and Internal Stan=dards to Measure

The ICP Expert software is designed in suc=h a way that a method =E2=80=9Ctemplate=E2=80=9D may be set up and re-used =for any number of subsequent analyses. When a run commences, the template f=ile is converted to an ICP ExpertWork=sheetFile (.esws)=E2=80=94which is =identical to the template file except that it stores analysis results and a=rchives instrument measurement conditions. It is important to keep in mind =that all updates must be applied to the template file in order to be presen=t in future runs. Altering the worksheet file (e.g. changing a calibration =type, internal standard, removing or adding new lines, adjusting the standa=rds table, etc) only applies to the respective worksheet.

Agilent ICP-OES 5110 User Guide (5)Figure 2: ICP Expert Elements Menu =for selecting analytical lines and assigning internal standards

Specifying Instrument Measurement Conditions

A considerable amount of finesse is required to improve elemental re=sults by changing the measurement conditions. By default, use the method de=veloped on x369. It is stored under the name ICP-Template-Master on the ICP= host PC. Table 5 lists the parameter values nece=ssary to recreate the measurement conditions. If certain instrument compone=nts or parameters are changed, then all conditions must again be optimized =as they are interlinked. In particular, adjust measurement conditions if:=p>

    • The sample isolation loop or any of the sample introduction lines= are exchanged for one of different length and/or internal diameter.
    • The pump rate is altered, or any time events are changed (e.g. va=lve uptake delay, rinse time, etc).
    • The number of condition sets changes from two, or SVDV is used.
      Agilent ICP-OES 5110 User Guide (6)
      Figure 3: ICP Expert Conditions Menu for specifying instrument mea=surement parameters, assigning condition sets to individual lines, and sett=ing integration areas. Note: These parameters cannot be changed once the se=quence has started.

      Table 4: List of standard measurement parameters for ICP-OES anal=ysis of interstitial water, sediment and hard rock. The firstconditio=n set to be run must include a 30 second plasma stabilization time, the pla=sma will remain stabilized for all subsequent condition sets provided the R=F power and Ar flows are the same.

      Parameter

      Common Conditions

      Condition Set 1

      Condition Set 2

      Replicates

      3

      Pump Speed (rpm)

      12

      Pump Rate =E2=80=93Uptake (mL/min)

      28

      Pump Rate =E2=80=93Inject (mL/min)

      0.5

      Valve uptake delay (s)

      18.0

      Bubble Injection Time (s)

      2.0

      Pre-emptive Rinse Time (s)

      2.0

      Rinse Time (s)

      5

      Read Time (s)

      5

      5

      RF Power (kW)

      1.20

      1.20

      Stabilization Time (s)

      30

      Viewing mode

      Axial

      Radial

      Viewing Height (mm)

      8

      8

      Nebulizer Flow (L/min)

      0.70

      0.70

      Plasma Flow (L/min)

      12.0

      12.0

      Auxiliary Flow (L/min)

      1.00

      1.00

      Make up Flow (L/min)

      0.00

      0.00

      Parameters for Common Conditions:

      Replicates: The number of integrations for each =condition set per sample.

      Pump speed (rpm): The instrument peristaltic pum=p speed.

      Pump rate =E2=80=93 Uptake (mL/min): The r=ate at which sample is drawn through the sample isolation loop connected to= the AVS.

      Pump rate =E2=80=93 Inject (mL/min): The rate at= which sample is pumped into the nebulizer/spray chamber from the sample is=olation loop.

      Valve uptake delay (s): The length of time sampl=e is pumped from the sample vial into and through the sample isolation loop=.

      Bubble injection time (s): The amount of time Ar= is pumped into the sample isolation loop after sample uptake but before ri=nse uptake. This allows a bubble to separate the sample and standard within= the uptake lines.

      Pre-emptive Rinse Time (s):

      Rinse time (s): The amount of time rinse solutio=n is drawn through the sample lines after a sample uptake.

      Par=ameters for Condition Sets

      Read time (s): The length of time for a single r=eplicate integration.

      RF Power (kW): The forward power supplied by the= RF coil to maintain the plasma.

      Stabilization Time (s): The amount of time allot=ted for sample to be introduced from the AVS sample isolation loop to the p=lasma before performing integrations.

      Viewing Mode: The angle from which the plasma is= viewed. In =E2=80=9CAxial=E2=80=9D view the instrument views the pla=sma from the top facing downwards. In radial view, the instrument views the= plasma from the side.

      Viewing Height (mm): 8: The position of the radi=al optics when viewing the plasma from the side.

      Nebulizer Flow (L/min): The argon flowrate intro=duced to the nebulizer which carries sample through the spray chamber

      Plasma Flow (L/min): The argon flowrate introduc=ed to the outer sheath of the torch in order to contain the plasma.

      Aux flow (L/min): The argon flowrate intro=duced to the torch to maintain the plasma

      Make up flow (L/min):

Creating a =Standards Table

By following the standards di=lution recipe given in this guide and using the default ICP Expert Templates (IODP_STANDARD_IW_MAJORS_MINORS_TEMPLATE.ests, IODP_STANDARD_HARDR=OCK_TEMPLATE_.ests), t=he standards table will not require major adjustment. In the case additiona=l or different standards must be run:

      1. Click on the Standards menu located o=n the left side of the ICP Expert window
      2. Increase the Number of Standards to t=he desired quantities. Adjust the decimal places for the desired leve=l of precision.
      3. Ensure Include Blank in Calibration i=s checked, and Correlation coefficient limit is s=et to 0.5000
      4. Within the table enter the standard names under Sol=ution Label and enter the concentrations within the pertinent= element columns. Attribute units to the concentrations by selecting from t=he dropdowns located immediately below the element header row.
      5. Adjust the =E2=80=9CCalibration Fit=E2=80=9D table so that the =Calibration Error for each line is at 1000%. Unch=eck Through Origin for each line.

Agilent ICP-OES 5110 User Guide (7)

Figure 4: ICP Expert Standards Menu where the numbe=r and concentrations of analytical standards may be edited. The user may sp=ecify the type of calibration fit=E2=80=94which may be altered before, duri=ng and after an analysis

Creating =a Sample Sequence

  1. Open the sample Sequence menu located on= the left side of the ICP Expert window.
  2. Increase the Number of Samples to the de=sired quantity.
  3. In the sample table, enter the sample names and/or TextIDs and any= dilution factors which deviate from the usual method dilution (dilution fa=ctors may likewise be adjusted after a run). Insert check standards every 8=-10 samples. If necessary, change the values in the Rack:Tube=em> column to designate each sample placement within the autosampl=er rack.
  4. Under the End of Run Actions, ensure the= pump speed is set to 12 rpm and the rinse is set to 10 minutes.
  5. Next, open the Autosampler menu located =below the Sequence menu. Notice the orientation o=f the autosampler displayed on the screen versus the autosampler placement =on the countertop. Assign a rack for the standards by right-clicking on a r=ack, highlighting Rack Use and selecting =Standards. Right-click on a single vial within the rack t=o set it as the Start Tube. Perform the same acti=ons for samples by assigning sample racks and sample start tubes. The defau=lt rack types are 60 samples x 16 mm OD.

Agilent ICP-OES 5110 User Guide (8)

Figure 5: ICP Expert Sequence Menu for setting up a= sample sequence and designating vial positions within the autosampler rack=s.

Agilent ICP-OES 5110 User Guide (9)

Figure 6: ICP Expert Autosampler Menu for assigning= racks and vials to positions within the autosampler. The autosampler probe= may be manually controlled from this menu.

Startin=g and Monitoring a Run

Within the Analysis menu, located on the l=efthand side of the ICP Expert window (Figure 3), occasionally monitor the results during acquisit=ion.

  1. Begin an analysis only after the standards and samples have been p=repared and placed in the autosampler (with caps off), a standards table an=d sequence have been created in ICP Expert, and t=he correct measurement conditions have been applied on the Cond=itions tab. Press the Run button lo=cated on the top menu bar of ICP Expert. A messag=e will appear asking to save the template as a worksheet file (.esws). Save= to an expedition related data directory on the PC.
  2. As the instrument measures, periodically click on cells within the= Results table to display the scan profile, calib=ration curve, and measurement statistics for each sample=E2=80=99s replicat=e integrations.
  3. In the spectrum window, move the dotted red vertical hash line so =that it coincides with a peak maximum (Note: the adjustmen=t propagates through all scans of the respective line). Ensure the entire p=eak is within the integration area. Click and drag the background points so= there is minimal overlap with any spectral interferences. The type of back=ground correction may be changed by right-clicking on the spectrum graph, h=ighlighting Background fit and changing the selec=tion.
  4. Ensure that the RSDs for each element are within the acceptable ra=nge. For values above the instrument detection limits, expect most RSDs to =be below 1-2%. Values above but near the LOD will typically have an RSD of =5%, whereas values below the LOD will typically return RSD=E2=80=99s of 5%+=. After measuring the standards, if there is a systematic increasing/decrea=sing trend in intensity for the three replicate integrations, stop the run =and troubleshoot. (See Section Troubleshooting for help).
  5. Outliers may be removed by selecting a sample in the results table= and unchecking the boxes for Replicate located o=n the pane at the bottom of the screen. The software disregards a sample/st=andard if all replicates are removed.
  6. If necessary, change the calibration type (linear, quadratic, rati=onal) by navigating to the Standards menu and cha=nging the selection within the Calibration Fit me=nu.
  7. On an element case-by-case basis, remove the replicates for high-e=nd standards which greatly over range the sample concentrations.

Agilent ICP-OES 5110 User Guide (10)

Figure 7: ICP Expert Analysis window. User may view= analytical results during acquisition, dynamically change background corre=ctions and integration areas, flag outliers, and view calibrations

Exporting, Vetting and Uploading Data

Follow the subsequent steps only after a run has completed, the cali=brations have been verified, dilutions have been taken into account, values= below LODs have been disregarded and results are ready for upload. Follow =the guidelines in the Quality Assurance and Data Reduction section when vet=ting ICP-OES results.

  1. For each element wavelength in the results table, right-click on t=he column header, select Column Properties and to=ggle off all result flags (Figure 6).
  2. Left-click the empty cell on the left-most column of the Results t=able (left of the Rack:Tube header) to select all= the results. Right-click the same cell then select =E2=80=9CExport selecte=d solutions.=E2=80=9D Save the file to an expedition specific directory.
  3. Open the AIDR-ICP Data Reduction.xlsm. On the Raw Data= worksheet open the user menu (CTRL+SHIFT+W) and select Import Data. Follow the prompts.
  4. Manually Copy the Condition Sets and Element Lists tables from ICP= Expert to the appropriate tables located on the Condition Set =and Element List tab in the Agilent Data Reduction Program. O=pen the user menu on the Raw Data worksheet and <=strong>Format Data.
  5. (Optional) Download a curatorial report from LORE and paste it to =the table on the Curatorial Report tab.
  6. On the Reduced Data tab, open the menu (=CTRL+SHIFT+W) and click Refresh PivotTable.
  7. Use the slicers to filter out undesired elemental wavelengths. Por=ewater graphs may be generated by opening the menu and selecting Show Concentration Plots.
  8. At this point, pass the workbook over to the geochemists. After th=e data has been vetted, open the menu (CTRL+SHIFT+W) on the Red=uced Data tab and select Spreadsheet Uploader For=mat. The data will be formatted for upload.
  9. Paste into Spreadsheet uploader, validate the sheet, then upload t=o LIMS. Data must be pasted into Spreadsheet Uploader in chunks of 500 rows= or less.

Instr=ument Shutdown Procedure

  1. Cycle the nitric acid rinse solution for 10 minutes, followed by D=I water for 5 minutes, then remove the sample uptake tubing from solution a=nd allow air to purge the lines and introduction system for 10 minutes or t=o dryness.
  2. Extinguish the plasma by clicking Plasma off from the ICP Expert menu.
  3. Disengage the peristaltic pump tubing on both the instrument and a=utosampler.
  4. After 10 minutes necessary for the RF coil to fully cool, switch o=ff the water cooler.
  5. If another analysis will be conducted within the following week, l=eave the instrument on with Ar flowing (usage is ~2.5 psi/hr in standby). I=f it is the end of expedition or there will be a long interval between the =next analysis, turn off the Ar gas inlet by closing the wall-mounted valve =located above the instrument. Turn off the power using the switch on the fr=ont left, wait for the green LED to stop blinking, then turn off the mains =power switch located on the rear left of the instrument.
  6. Leave the vials in the autosampler rack until the results have bee=n inspected to ensure no two vials were misplaced during the analysis. Remo=ve the labels from the vials, empty the contents into the waste container, =and rinse the vials with tap water. Soak them in 10% HNO3 for 12= hours.
  7. If proceeding to an interstitial water analysis after performing a= hard rock analysis change all the sample introduction tubing and glassware= to prevent Li and B contamination. These include the autosampler probe, sa=mple uptake tubing, sample introduction loop, nebulizer and spray chamber.<=/li>


Cleaning Instrument Components:

Follow the routine cleaning procedure outlined in the Ag=ilent 5100 and 5100 ICP-OES User=E2=80=99s Guide when cleanin=g or servicing any instrument components. Walkthrough videos and step-by-st=ep instructions are accessible through the ICP Expert Help menu, underneath the =E2=80=9CHow to,=E2=80=9D =E2=80=9CTroublesh=ooting,=E2=80=9D and =E2=80=9CMaintenance=E2=80=9D folders.

Daily= Cleaning and Maintenance

  • Check the torch for cleanliness. To clean the torch, soak the end =in a small volume of 50% aqua regia. For 200 mL, combine 100 mL DI water, 2=5 mL of concentrated HNO3, and 75 mL of concentrated HCl in a gl=ass beaker. Fresh aqua regia has a darkish orange-brown hue that gradually =becomes lighter as the nitrogen degasses as nitrogen dioxide, at which poin=t it should be replaced. Caution: Always add acid to= water. Aqua regia is more corrosive than its components taken separately. =Wear proper PPE, including a face shield and lab coat. Work in a fume hood.= Store aqua regia in a glass or Teflon container as it will corrode regular= LDPE or HDPE bottles.
  • Inspect the elasticity of the peristaltic pump and AVS tubing, rep=lace if necessary.
  • Flush the sample flow paths with DI water to remove any acidic sol=ution and ensure there are no blockages.
  • Wrap the CRM bottle necks and caps in Parafilm to prevent evaporat=ion.

Week=ly Cleaning and Maintenance

  • Clean the torch, cone, snout, spray chamber and nebulizer. Consult= ICP Expert Help Menu for in-depth videos of remo=val, cleaning, and installation procedures.

Agilent ICP-OES 5110 User Guide (11)Agilent ICP-OES 5110 User Guide (12)


Figure 8: Cone before cleaning &nb=sp; Figure 9:= Cone after cleaning with a non-metal scouring pad in DI water.
Figur=e 8: Cone before cleaning

Mon=thly Cleaning and Maintenance

  • Clean the inlet filter for the cooling air
  • Perform an ICP-OES calibration
  • Remove and clean the water filter
  • Inspect the axial and radial optics windows, replace if necessary<=/li>
  • Check the water level in the water chiller
  • Clean the water chiller radiator of dirt and dust build-up
  • Drain the water chiller and either refill or treat with algaecide<=/li>

=Interstitial Waters Standard Report

  • Exp:expedition number
  • Site:site number
  • Hole:hole number
  • Core:core number
  • Type:type indicates the coring= tool used to recover the core (typical types are F, H, R, X).
  • Sect:section number
  • A/W:archive (A) or working (W)= section half.
  • Top offset on section (cm):pos=ition of the upper edge of the sample, measured relative to the top of the =section.
  • Bottom offset on section (cm):=position of the lower edge of the sample, measured relative to the top of t=he section.
  • Top depth CSF-A (m):position o=f observation expressed relative to the top of the hole.
  • Top depth [other] (m):position= of observation expressed relative to the top of the hole. The location is =presented in a scale selected by the science party or the report user.
  • Sampling tool:tool used to col=lect sample
  • Data columns:header lists para=meter measured and concentration units, followed by wavelength (for ICP-AES=) and then analysis method.

Expa=nded ICPAES Report

  • Exp:expedition number
  • Site:site number
  • Hole:hole number
  • Core:core number
  • Type:type indicates the coring= tool used to recover the core (typical types are F, H, R, X).
  • Sect:section number
  • A/W:archive (A) or working (W)= section half.
  • text_id:automatically generated uniqu=e database identifier for a sample, visible on printed labels
  • sample_number:sample number of= sample. text ID with sample type prefix removed.
  • label_id:id combining exp, sit=e, hole, core, type, sect, A/W, parent sample name (if any), sample name
  • sample_name:name of sample
  • x_sample_state:
  • x_project:expedition project t=he sample is uploaded under. typically the same as Exp.
  • x_capt_loc:
  • location:location sample was t=aken
  • x_sampling_tool:tool used to c=ollect sample
  • changed_by:name of person who =uploaded sample
  • changed_on:date and time sampl=e was uploaded
  • sample_type:type of sample. ty=pically LIQ, for liquid.
  • x_offset:top offset of parent sample where =sample was taken in m
  • x_offset_cm:top offset of pare=nt sample where sample was taken in cm
  • x_bottom_offset_cm:bottom offset of parent =sample where sample was taken in cm
  • x_diameter:
  • x_idmp:
  • x_orig_len:
  • x_length:length of sample in m
  • x_lengeth_cm:length of s=ample in cm
  • status:
  • old_status:
  • original_sample:
  • parent_sample:
  • standard:
  • login_by:name of person logged into LIMS ap=plication used for this test
  • sampled_date:
  • legacy:
  • test changed_on:date of last edit of analys=is
  • test date_started:date analysi=s was started
  • test group_name:
  • test status:
  • test old_status:
  • test test_number:unique number= associated with the instrument measurement steps that produced these data<=/li>
  • test date_received:date analysis was upload=ed to LIMS
  • test instrument:instrument used to perform =analysis
  • test analysis:analysis type
  • test x_project:project test was assigned to=
  • test version:
  • test order_number:
  • test replicate_test:
  • test replicate_count:
  • rest sample_number:sample number for sample= the analysis was performed on
  • Top depth CSF-A (m):position of observation= expressed relative to the top of the hole.

  • Bottom depth CSF-A (m):position of observat=ion expressed relative to the top of the hole.

  • Top depth CSF-B (m):

  • Bottom depth CSF-B (m):

  • batch_id:
  • calibrated_name:element analyzed along with= concentration unit
  • calibration:
  • concentration:measured concentration of ana=lyzed element
  • corrected_intensity:
  • correlation:
  • drift_asman_id:
  • drift_corrected:
  • drift_filename:
  • element_conc_dissolved (uM)
  • element_name: name of analyzed element
  • ssup_asman_id:download link for the batch o=f data uploaded through spreadsheet uploader
  • ssup_filename:filename of spreadsheet uploa=der batch
  • view:view mode that analysis was performed =in (axial, radial, svdv)
  • wavelength:wavelength that element was meas=ured at
  • sample description:observation=s recorded about the sample itself

  • test test_comment:observations= about a measurement or the measurement process; some measurement observati=ons may be under Result comments

  • result comments:observations a=bout a measurement or the measurement process; some measurement observation=s may be under Test Comments

Note:Iron is expressed as Fe2O3t, or total Iron (III) oxi=de.

Aside from performing drift corrections, the Agilent ICP= Expert software accounts for all data reduction. The option =to normalize to any analyzed internal standard wavelength is available befo=re, during and after a run. Additionally, quality control specifications ma=y be changed to flag troublesome data. The following quality controls ultim=ately fall under the purview of the geochemists.

Implement the following steps to vet the data:

  1. Ensure there are no spectral interferences overlapping the peaks o=f interest.=20
    1. If spectral interferences are present, inspect the interference =level in the blank versus the level in the standards. If the interference i=s not constant between all standards, disregard the line.
  2. Ensure the linear/quadratic/rational relationship of each waveleng=th calibration curve.
  3. Ensure the sample concentrations are less than the greatest calibr=ation point. Remove standards from the calibration which greatly over range= elemental abundances in the samples as they may bias the calibration curve= slope.
  4. Do not remove a point from the calibration unless:=20
    1. The RSD % is outside of the allowable.
    2. A student T-Test or Grubbs Outlier Test has been performed on th=e point. Use the signal intensity-to-concentration ratios to compare the po=int against the mean and standard deviation of the population of the other =points making up the calibration curve.
    3. The liquid level of the vial in the autosampler rack indicates s=ome sample volume was not introduced.
  5. For each line, verify that the accuracy (% difference) of any chec=k standards is within tolerance.
  6. Ensure the % change in drift standards throughout the course of th=e analytical run is insignificant, or, if it is not, take into account drif=t with linear drift factors. If the drift is random (non-systematic), then =ignore drift corrections and consider troubleshooting precision issues.
  7. Ensure there is not a significant deviation in the slopes of calib=ration curves as compared to the same curves in previous runs.
  8. Before uploading to LIMS, flag values below detection limit, highe=r than the highest calibration point, or have poor %RSD. AIDR has capabilit=ies for this.

Sediment/R=ock Standards

  1. For a given sample/standard, ensure that the total % recovery of m=ajor oxides is 100 =C2=B1 2 wt%.
  2. Periodically ensure that sediment and rock standard certified refe=rence material values are up to date with the literature.
Pl=asma Extinguishes upon Startup:

This occurs when air contaminates the torch box or the torch is not =dry. Verify the torch is dry. Allow Argon to purge the torch box for 10 min=utes or so. When igniting the plasma, press a glove finger against the end =of the rinse uptake tubing connected to the spray chamber to cut off it fro=m drawing in air or solution.

  • Attempt to implement the SVDV dual view mode for simultaneous axia=l and radial measurement. This will reduce analysis time, argon usage, and =the amount of pore water required per sample analysis.
  1. Adapt the current ICP Template by changing the number of condition= sets to 1 (SVDV).
  2. Adjust the Common Conditions so there is at least a 30 second dela=y after sample initially reaches the torch for the plasma to stabilize. It =is easiest to time this by running a sample containing sodium as it emits a= bright orange color within the plasma.
  3. Adjust the pump conditions so that the sample isolation loop fills= with enough sample for each replicate integration. Watch the fluids flow t=hrough the lines to aid in timing. If the measurement finishes before all t=he sample has been ejected from the sample loop, then on the next run incre=ase the =E2=80=9CPre-emptive rinse time=E2=80=9D so that rinse solution is =drawn into the sample isolation loop in place of the tail-end volume of sam=ple.
  4. After optimization, run a calibration curve. Ensure there are no s=ystematic increases or decreases in intensities across each replicate. RSD =should be below 2%. Inspect the calibration curves for linearity (or quadra=tic fits). The squared correlation coefficient must be greater than 0.90 in= order to be acceptable.
  5. Compare spectral interferences for each element wavelength between= the current Axial/Radial method and SVDV. Investigate the presence or abse=nce of interferences and each interference intensity in relation to the ana=lyte peak intensity. Calculate detections limits. Compile the data into a t=able and compare against the Axial/Radial method.=20
    1. Headers: Analytical Wavelengths
    2. Rows: Detection Limits, % RSD (low and high sample), % Accuracy =(Low and High sample), squared correlation coefficient, calibration curve s=lope and intercept, dynamic range, internal standards used, spectral interf=erences.
  • Attempt to optimize the RF forward power and viewing height parame=ters in Axial/Radial mode. This may improve analytical measurement and dete=ction of minors elements such as Fe and P. Keep in mind that the plasma mus=t stabilize for a period if the RF forward power is altered.
  • Purchase and implement an Argon Humidifier to help reduce precipit=ate buildup in the nebulizer.
  • Create a generic report template using the ICP report designer tha=t includes all the measurement parameters, calibration information, sequenc=e information, results and statistics using the ICP Expert= Report Designer. Reports are exported as pdfs. Store the reports =to Uservol and to the instrument host PC. Move towards implementing an uplo=ader in MUT which captures reports.
  • Create an Excel script (or other) to aid in quickly visualizing da=ta downhole from the data exported after a run.
  • Create an Excel script to apply a linear drift correction to selec=t lines.
  • Create a Database (Excel or other) which captures calibration info=rmation for future reference.
  • Revisit whether or not sample/standard residues from LOI yield val=id measurements, or instead, direct fluxing of standards before combustion =should be performed.=20
    • Certified reference materials are only valid for drying at 120==C2=B0C.
    • LOI is loss of H2O, CO2 but also gain of O=2 from oxidation products, which complicates the final mass valu=e
    • Nearly 20 hrs of sample preparation time may be saved.

Agilent Technologies, ICP Expert Software, Version 7.3.1.9507, 2017<=/p>

Agilent Technologies =E2=80=9CAgilent 5100 and 5110 ICP-OES User=E2==80=99s Guide,=E2=80=9D Manual # G8010-90002, October 2016, 4th =Ed, Malaysia

Agilent Technologies =E2=80=9CFor Your Safety User=E2=80=99s Guide,==E2=80=9D Manual # 5971-6636, February 2014, 2nd Ed, Malaysia

Agilent Technologies =E2=80=9CAgilent SPS 4 Autosampler User=E2=80==99s Guide,=E2=80=9D Manual # G8410-90000, May 2015 Revision A, Malaysia

Bacon, S., Culkin, F., Higgs, N., and Ridout, P., 2007. IAPSO standa=rd seawater: definition of the uncertainty in the calibration procedure, an=d stability of recent batches. J. Atmos. Oceanic Technol., 24(10):=1785=E2=80=931799. doi:10.1175/JTECH2081.1

Gieskes, J.M., Gamo, T., and Brumsack, H., 1991. Chemical methods for interstitial water analysis aboard JOID=ES Resolution. ODP Tech. Note, 15. doi:10.2973/odp.tn.15.1991=

Houpt, D., 2013. Leeman Prodigy ICP-AES User Guide. International Oc=ean Discovery Program.

Millero, F.J., Feistel, R., Wright, D.G., andMcDougall, T.J., =2008. The composition of Standard Seawater and the definition of the Refere=nce-Composition Salinity Scale. Deep-Sea Res., Part. I, 55(1):50==E2=80=9372. doi:10.1016/j.dsr.2007.10.001

Murray, R.W., Miller, D.J., and Kryc, K.A., 2000. Analysis of major =and trace elements in rocks, sediments, and interstitial waters by inductiv=ely coupled plasma=E2=80=93atomic emission spectrometry (ICP-AES). ODP =Tech. Note, 29. doi:10.2973/odp.tn.29.2000

Pilson, M.E.Q., 1998. Major Constituents of Seawater. In: An Int=roduction to the Chemistry of the Sea. Upper Saddle River, NJ (Prentic=e Hall).

Skoog et al. 1992 Fundamentals of Analytical Chemistry 7th Ed.

Skoog et al. 1997 Principles of Instrumental Analysis 5th Ed.

Summerhayes, C.P., and Thorpe, S.A., 1996. Oceanography An Illus=trated Guide, Chapter 11, 165=E2=80=93181.

The following tables detail analytical wavelengths, internal standar=ds, and viewing modes for elements measured in the Hardrock/Sediment and In=terstial Waters methods. Each table is followed by a list of similar line c=ombinations, which have been rejected for various reasons listed in each ta=ble. An Excel spreadsheet (Hardrock-Sediment_Interstital Waters_Default Ana=lytical Wavelengths Library.xlsx) containing this information is available =on the desktop of the ICP host computer. If should be periodically updated =as lines are added or removed.

Interst=itial Waters Method:

Use the analytical lines, internal standards and torch views listed =in Table 5 to recreate the default instrument con=dition set for analysis of dissolved elements in pore waters. These values =are appropriate for the interstitial water dilution scheme given in the tex=t above. Altering the dilution scheme by changing the concentrations of ana=lytical standards or diluting samples and standards by a ratio other than 1=:10, may affect the respective calibration curves, in which case, these con=ditions may need to be adjusted.

Table 5: List of instrument conditions to recreate the method for me=asurement of major and minor elements in interstitial water.

Element

Wavelength (nm)

Type

Internal Standard (Wavelength nm)

View

B

208.956

Analyte

Sb (206.834)

Axial

B

249.678

Analyte

Sb (206.834)

Axial

B

249.772

Analyte

Sb (206.834)

Radial

Ba

230.424

Analyte

Sb (206.834)

Axial

Ba

230.424

Analyte

Sb (206.834)

Radial

Ba

455.403

Analyte

Sc (424.682)

Axial

Ba

455.403

Analyte

Sc (361.383)

Radial

Be

313.042

Internal Standard

None

Axial

Ca

315.887

Analyte

Sc (361.383)

Axial

Ca

315.887

Analyte

Sc (361.383)

Radial

Ca

317.933

Analyte

Sc (361.383)

Axial

Ca

317.933

Analyte

Sc (361.383)

Radial

Ca

318.127

Analyte

Sc (361.383)

Axial

Ca

318.127

Analyte

Sc (361.383)

Radial

Ca

431.865

Analyte

Sc (361.383)

Axial

Ca

431.865

Analyte

Sc (361.383)

Radial

Fe

238.204

Analyte

Sc (361.383)

Axial

Fe

238.204

Analyte

Be (313.042)

Radial

Fe

239.563

Analyte

Be (313.042)

Axial

Fe

239.563

Analyte

Sc (361.383)

Radial

Fe

259.94

Analyte

Be (313.042)

Axial

Fe

259.94

Analyte

Sc (361.383)

Radial

In

230.606

Internal Standard

None

Radial

In

325.609

Internal Standard

None

Axial

K

766.491

Analyte

In (325.609)

Axial

K

766.491

Analyte

In (325.609)

Radial

K

769.897

Analyte

In (325.609)

Axial

K

769.897

Analyte

In (325.609)

Radial

Li

670.783

Analyte

In (325.609)

Radial

Mg

202.582

Analyte

Be (313.042)

Axial

Mg

277.983

Analyte

Be (313.042)

Axial

Mg

278.142

Analyte

Be (313.042)

Axial

Mg

279.078

Analyte

Sc (361.383)

Axial

Mg

279.553

Analyte

Sc (361.383)

Radial

Mn

257.61

Analyte

Be (313.042)

Axial

Mn

257.61

Analyte

Sc (361.383)

Radial

Mn

259.372

Analyte

Be (313.042)

Axial

Mn

259.372

Analyte

Sc (361.383)

Radial

Na

330.298

Analyte

In (325.609)

Axial

Na

330.298

Analyte

In (325.609)

Radial

Na

588.995

Analyte

In (325.609)

Axial

Na

588.995

Analyte

In (325.609)

Radial

Na

589.592

Analyte

In (325.609)

Radial

P

177.434

Analyte

Sb (206.834)

Axial

P

178.222

Analyte

Sb (206.834)

Axial

P

213.618

Analyte

Sb (206.834)

Axial

S

178.165

Analyte

Sb (206.834)

Axial

S

178.165

Analyte

In (325.609)

Axial

S

180.669

Analyte

In (325.609)

Axial

S

180.669

Analyte

Sb (206.834)

Axial

S

182.562

Analyte

In (325.609)

Axial

S

182.562

Analyte

Sb (206.834)

Axial

Sb

206.834

Internal Standard

None

Axial

Sc

361.383

Internal Standard

None

Axial

Sc

424.682

Internal Standard

None

Radial

Si

221.667

Analyte

Sb (206.834)

Axial

Si

251.611

Analyte

In (325.609)

Axial

Si

288.158

Analyte

In (325.609)

Axial

Sr

215.283

Analyte

In (325.609)

Axial

Sr

215.283

Analyte

In (325.609)

Radial

Sr

407.771

Analyte

In (230.606)

Axial

Sr

407.771

Analyte

In (230.606)

Radial

Sr

421.552

Analyte

Sc (361.383)

Axial

Sr

421.552

Analyte

Sc (361.383)

Radial

Sr

460.733

Analyte

In (325.609)

Axial

Sr

460.733

Analyte

In (325.609)

Radial

Element Wavelengths Excluded from the Inte=rstitial Waters Analysis and Why

Element

Wavelength (nm)

Type

Internal Standard (Wavelength nm)

View

Reason

Li

670.783

Analyte

In (325.609)

Axial

Poor Response, Poor Precision

Mg

279.553

Analyte

Sc (361.383)

Axial

Nonlinear Response

Mg

280.27

Analyte

Sc (361.383)

Axial

Nonlinear Response

Na

589.592

Analyte

In (325.609)

Axial

Detector Oversaturation, Self-Absorption

=td>

Hardro=ck and Sediments Method

Use the following elemental lines to recreate the method used for an=alysis of rocks and sediments. Several lines for each element are included =to bracket a wide range of concentrations (low concentrations need lines wi=th large instrument responses, and vice-versa for high concentrations), and= to provide a larger selection of alternative lines in the case of interfer=ences. This custom list of wavelengths is based on the hard rock dilution s=cheme detailed in the text.

Table 6: List of instrument conditions to recreate =the method for measurement of rocks and sediments.

Element

Wavelength (nm)

Type

Internal Standard (Wavelength nm)

View

Al

308.215

Analyte

In (325.609)

Axial

Al

308.215

Analyte

In (325.609)

Radial

Al

396.152

Analyte

In (325.609)

Radial

Al

396.152

Analyte

In (325.609)

Axial

B

208.889

Analyte

Sb (206.834)

Radial

B

208.889

Analyte

Sb (206.834)

Axial

B

208.956

Analyte

Sb (206.834)

Axial

B

208.956

Analyte

Sb (206.834)

Radial

B

249.678

Analyte

Sb (206.834)

Axial

B

249.678

Analyte

Sb (206.834)

Radial

Ba

230.424

Analyte

Be (313.042)

Axial

Ba

230.424

Analyte

Be (313.042)

Radial

Ba

455.403

Analyte

Be (313.042)

Radial

Ba

455.403

Analyte

Be (313.042)

Axial

Be

313.042

Internal Standard

None

Radial

Be

313.042

Internal Standard

None

Axial

Ca

315.887

Analyte

Be (313.042)

Axial

Ca

315.887

Analyte

Be (313.042)

Radial

Ca

317.933

Analyte

Be (313.042)

Axial

Ca

317.933

Analyte

Be (313.042)

Radial

Ca

318.127

Analyte

Be (313.042)

Axial

Ca

318.127

Analyte

Be (313.042)

Radial

Ca

431.865

Analyte

In (325.609)

Axial

Ca

431.865

Analyte

In (325.609)

Radial

Co

228.615

Analyte

In (230.606)

Radial

Co

228.615

Analyte

In (230.606)

Axial

Co

230.786

Analyte

In (230.606)

Axial

Cr

205.56

Analyte

In (230.606)

Axial

Cr

205.56

Analyte

In (230.606)

Radial

Cr

267.716

Analyte

In (230.606)

Axial

Cr

267.716

Analyte

In (230.606)

Radial

Cu

327.395

Analyte

In (325.609)

Radial

Cu

327.395

Analyte

In (325.609)

Axial

Eu

420.504

Analyte

Be (313.042)

Radial

Fe

217.808

Analyte

Sb (206.834)

Axial

Fe

217.808

Analyte

Sb (206.834)

Radial

Fe

238.204

Analyte

In (230.606)

Radial

Fe

238.204

Analyte

In (230.606)

Axial

Fe

239.563

Analyte

In (230.606)

Axial

Fe

239.563

Analyte

In (230.606)

Radial

Fe

258.588

Analyte

In (230.606)

Radial

Fe

258.588

Analyte

In (230.606)

Axial

Fe

259.94

Analyte

In (230.606)

Axial

Fe

259.94

Analyte

In (230.606)

Radial

In

230.606

Internal Standard

None

Radial

In

230.606

Internal Standard

None

Axial

In

325.609

Internal Standard

None

Axial

In

325.609

Internal Standard

None

Radial

K

766.491

Analyte

In (325.609)

Radial

K

766.491

Analyte

In (325.609)

Axial

K

769.897

Analyte

In (325.609)

Radial

La

333.749

Analyte

Be (313.042)

Axial

La

333.749

Analyte

Be (313.042)

Radial

La

379.082

Analyte

Be (313.042)

Axial

La

379.082

Analyte

Be (313.042)

Radial

Li

670.783

Analyte

In (325.609)

Radial

Li

670.783

Analyte

In (325.609)

Axial

Mg

202.582

Analyte

Sb (206.834)

Radial

Mg

202.582

Analyte

Sb (206.834)

Axial

Mg

277.983

Analyte

In (325.609)

Axial

Mg

277.983

Analyte

In (325.609)

Radial

Mg

278.142

Analyte

In (325.609)

Radial

Mg

278.142

Analyte

In (325.609)

Axial

Mg

279.078

Analyte

Be (313.042)

Radial

Mg

279.078

Analyte

Be (313.042)

Axial

Mg

279.553

Analyte

Be (313.042)

Axial

Mg

279.553

Analyte

Be (313.042)

Radial

Mg

280.27

Analyte

Be (313.042)

Axial

Mg

280.27

Analyte

Be (313.042)

Radial

Mn

257.61

Analyte

Be (313.042)

Axial

Mn

257.61

Analyte

Be (313.042)

Radial

Mn

259.372

Analyte

Be (313.042)

Axial

Mn

259.372

Analyte

Be (313.042)

Radial

Mo

202.032

Analyte

In (230.606)

Radial

Mo

202.032

Analyte

In (230.606)

Axial

Mo

284.824

Analyte

In (325.609)

Axial

Na

588.995

Analyte

In (325.609)

Axial

Na

588.995

Analyte

In (325.609)

Radial

Na

589.592

Analyte

In (325.609)

Radial

Na

589.592

Analyte

In (325.609)

Axial

Nb

295.088

Analyte

Be (313.042)

Radial

Ni

222.295

Analyte

In (230.606)

Axial

Ni

222.295

Analyte

In (230.606)

Radial

Ni

231.604

Analyte

In (230.606)

Axial

Ni

231.604

Analyte

In (230.606)

Radial

P

177.434

Analyte

Sb (206.834)

Radial

P

177.434

Analyte

Sb (206.834)

Axial

P

178.222

Analyte

Sb (206.834)

Radial

P

178.222

Analyte

Sb (206.834)

Axial

P

213.618

Analyte

Sb (206.834)

Radial

P

213.618

Analyte

Sb (206.834)

Axial

S

178.165

Analyte

In (325.609)

Axial

S

178.165

Analyte

Sb (206.834)

Axial

S

180.669

Analyte

In (325.609)

Axial

S

180.669

Analyte

Sb (206.834)

Axial

S

182.562

Analyte

In (325.609)

Axial

S

182.562

Analyte

Sb (206.834)

Axial

Sb

206.834

Internal Standard

None

Radial

Sb

206.834

Internal Standard

None

Axial

Sc

361.383

Analyte

Be (313.042)

Axial

Sc

361.383

Analyte

Be (313.042)

Radial

Sc

424.682

Analyte

Be (313.042)

Radial

Sc

424.682

Analyte

Be (313.042)

Axial

Si

221.667

Analyte

In (325.609)

Radial

Si

221.667

Analyte

In (325.609)

Axial

Si

251.611

Analyte

In (325.609)

Radial

Si

251.611

Analyte

In (325.609)

Axial

Si

288.158

Analyte

In (325.609)

Axial

Si

288.158

Analyte

In (325.609)

Radial

Sr

407.771

Analyte

Be (313.042)

Axial

Sr

407.771

Analyte

Be (313.042)

Radial

Sr

421.552

Analyte

Be (313.042)

Radial

Sr

421.552

Analyte

Be (313.042)

Axial

Sr

460.733

Analyte

In (325.609)

Axial

Ti

334.941

Analyte

Be (313.042)

Axial

Ti

334.941

Analyte

Be (313.042)

Radial

Ti

368.52

Analyte

Be (313.042)

Axial

Ti

368.52

Analyte

Be (313.042)

Radial

V

292.401

Analyte

Be (313.042)

Radial

V

292.401

Analyte

Be (313.042)

Axial

V

326.769

Analyte

Be (313.042)

Axial

V

326.769

Analyte

Be (313.042)

Radial

Y

360.074

Analyte

Be (313.042)

Radial

Y

360.074

Analyte

Be (313.042)

Axial

Y

371.029

Analyte

Be (313.042)

Axial

Y

371.029

Analyte

Be (313.042)

Radial

Zn

202.548

Analyte

In (230.606)

Axial

Zn

202.548

Analyte

In (230.606)

Radial

Zn

213.857

Analyte

Sb (206.834)

Axial

Zn

213.857

Analyte

Sb (206.834)

Radial

Zr

327.307

Analyte

Be (313.042)

Axial

Zr

343.823

Analyte

Be (313.042)

Radial

Element Wavelengths Excluded from the Hardrock Analy=sis and Why

Element

Wavelength (nm)

Type

Internal Standard (Wavelength nm)

View

Reason

Ce

418.659

Analyte

Be (313.042)

Axial

Poor RSD

Ce

418.659

Analyte

Be (313.042)

Radial

Poor RSD

Co

230.786

Analyte

In (230.606)

Radial

Poor % RSD for all concentrations of standards

Cu

324.754

Analyte

In (325.609)

Radial

Poor % RSD, peak rides on the fringe of a greater peak

Cu

324.754

Analyte

In (325.609)

Axial

Large underlying interference in the blank, good RSD

Eu

381.967

Analyte

Be (313.042)

Radial

Only background

Eu

381.967

Analyte

Be (313.042)

Axial

Only background

Eu

412.972

Analyte

Be (313.042)

Axial

Only background

Eu

412.972

Analyte

Be (313.042)

Radial

Only background

Eu

420.504

Analyte

Be (313.042)

Axial

Only background

K

769.897

Analyte

In (325.609)

Axial

Large interference peak, good RSD

Mo

284.824

Analyte

In (325.609)

Radial

Low signal, high %RSD

Na

330.298

Analyte

In (325.609)

Axial

Low S/B, rides on the slope of a larger peak, poor RSD

Na

330.298

Analyte

In (325.609)

Radial

Low S/B, rides on the slope of a larger peak, poor RSD

Nb

269.706

Analyte

Be (313.042)

Radial

Low S/B, poor RSD

Nb

269.706

Analyte

Be (313.042)

Axial

Low S/B, poor RSD

Nb

295.088

Analyte

Be (313.042)

Axial

Low S/B, poor RSD

Rb

780.026

Analyte

In (325.609)

Axial

Large interference peak, good RSD

Rb

780.026

Analyte

In (325.609)

Radial

Large interference peak, good RSD

Sr

215.283

Analyte

In (230.606)

Radial

High background, poor RSD

Sr

215.283

Analyte

In (230.606)

Axial

High background, poor RSD

Sr

460.733

Analyte

In (325.609)

Radial

Low S/B, rides on the slope of a larger peak, poor RSD

U

367.007

Analyte

In (325.609)

Radial

Only background, Low S/B, poor RSD

U

367.007

Analyte

In (325.609)

Axial

Only background, Low S/B, poor RSD

U

385.957

Analyte

In (325.609)

Radial

Only background, Low S/B, poor RSD

U

385.957

Analyte

In (325.609)

Axial

Only background, Low S/B, poor RSD

Table 6: Elemental units and conversion factors fro=m major oxides to element wt%

Element

Measurement Unit

Element Oxide

Measurement Unit

Factor to Convert Oxide to Elemental wt%

=td>

Factor to Convert Elemental wt% to Oxide

=td>

Zn

ppm

CaO

wt%

0.7143

1.3992

Zr

ppm

K2O

wt%

0.8301

1.2046

V

ppm

MgO

wt%

0.603

1.6582

Cr

ppm

Al2O3

wt%

0.5293

1.8895

Ba

ppm

Fe2O3t as (Fe2O3t)

Fe2O3t as (FeO)

wt%

0.6994

0.7773

1.4297

Sc

ppm

SiO2

wt%

0.4675

2.1392

Ni

ppm

P2O5

wt%

0.4365

2.2916

Cu

ppm

TiO2

wt%

0.5995

1.6681

Co

ppm

MnO

wt%

0.7745

1.2912

Sr

ppm

Na2O

wt%

0.7419

1.3480

Most LIMS components are directly saved as a pair of components: a R=ESULT table name for the name of the parameter, and RESULT.entry for the te=xt or numeric result. For the Inductively-Coupled Plasma=E2=80=94Optical Em=ission Spectrometer however, it was necessary to create a different structu=re. Three of the name fields in the RESULT table are analyte, concentration=, and wavelength. Any given result is a marriage of these three fields (e.g=., analyte =3D Mg, concentration =3D 51.060 mM, and wavelength =3D 257.61 n=m). These are organized on the RESULT table by use of the RESULT.replicate_=count field, so a given analyte entry, concentration entry, and wavelength =entry have the same replicate_count (e.g., /0, /1).

Although the ICP is used for both solid and liquid samples, the comp=onent table is common between them. The reports separate them by use of the= SAMPLE.sample_type field; all LIQ sample are considered to be interstitial= water sample, and all other sample types are lumped into the solids ICP re=port.

ANALYSIS TABLE NAME ABOUT TEXT
ICPAES (Solid & Liquid) SAMPLE Exp Exp: expedition number
ICPAES (Solid & Liquid) SAMPLE Site Site: site number
ICPAES (Solid & Liquid) SAMPLE Hole Hole: hole number
ICPAES (Solid & Liquid) SAMPLE Core Core: core number
ICPAES (Solid & Liquid) SAMPLE Type Type: type indicates the coring tool use=d to recover the core (typical types are F, H, R, X).
ICPAES (Solid & Liquid) SAMPLE Sect Sect: section number
ICPAES (Solid & Liquid) SAMPLE A/W A/W: archive (A) or working (W) section =half.
ICPAES (Solid & Liquid) SAMPLE text_id Text_ID: automatically generated databas=e identifier for a sample, also carried on the printed labels. This identif=ier is guaranteed to be unique across all samples.
ICPAES (Solid & Liquid) SAMPLE sample_number Sample Number: automatically generated d=atabase identifier for a sample. This is the primary key of the SAMPLE tabl=e.
ICPAES (Solid & Liquid) SAMPLE label_id Label identifier: automatically generate=d, human readable name for a sample that is printed on labels. This name is= not guaranteed unique across all samples.
ICPAES (Solid & Liquid) SAMPLE sample_name Sample name: short name that may be spec=ified for a sample. You can use an advanced filter to narrow your search by= this parameter.
ICPAES (Solid & Liquid) SAMPLE x_sample_state Sample state: Single-character identifie=r always set to "W" for samples; standards can vary.
ICPAES (Solid & Liquid) SAMPLE x_project Project: similar in scope to the expedit=ion number, the difference being that the project is the current cruise, wh=ereas expedition could refer to material/results obtained on previous cruis=es
ICPAES (Solid & Liquid) SAMPLE x_capt_loc Captured location: "captured location," =this field is usually null and is unnecessary because any sample captured o=n the JR has a sample_number ending in 1, and GCR ending in 2
ICPAES (Solid & Liquid) SAMPLE location Location: location that sample was taken=; this field is usually null and is unnecessary because any sample captured= on the JR has a sample_number ending in 1, and GCR ending in 2
ICPAES (Solid & Liquid) SAMPLE x_sampling_tool Sampling tool: sampling tool used to tak=e the sample (e.g., syringe, spatula)
ICPAES (Solid & Liquid) SAMPLE changed_by Changed by: username of account used to =make a change to a sample record
ICPAES (Solid & Liquid) SAMPLE changed_on Changed on: date/time stamp for change m=ade to a sample record
ICPAES (Solid & Liquid) SAMPLE sample_type Sample type: type of sample from a prede=fined list (e.g., HOLE, CORE, LIQ)
ICPAES (Solid & Liquid) SAMPLE x_offset Offset (m): top offset of sample from to=p of parent sample, expressed in meters.
ICPAES (Solid & Liquid) SAMPLE x_offset_cm Offset (cm): top offset of sample from t=op of parent sample, expressed in centimeters. This is a calculated field (=offset, converted to cm)
ICPAES (Solid & Liquid) SAMPLE x_bottom_offset_cm Bottom offset (cm): bottom offset of sam=ple from top of parent sample, expressed in centimeters. This is a calculat=ed field (offset + length, converted to cm)
ICPAES (Solid & Liquid) SAMPLE x_diameter Diameter (cm): diameter of sample, usual=ly applied only to CORE, SECT, SHLF, and WRND samples; however this field i=s null on both Exp. 390 and 393, so it is no longer populated by Sample Mas=ter
ICPAES (Solid & Liquid) SAMPLE x_orig_len Original length (m): field for the origi=nal length of a sample; not always (or reliably) populated
ICPAES (Solid & Liquid) SAMPLE x_length Length (m): field for the length of a sa=mple [as entered upon creation]
ICPAES (Solid & Liquid) SAMPLE x_length_cm Length (cm): field for the length of a s=ample. This is a calculated field (length, converted to cm).
ICPAES (Solid & Liquid) SAMPLE status Status: single-character code for the cu=rrent status of a sample (e.g., active, canceled)
ICPAES (Solid & Liquid) SAMPLE old_status Old status: single-character code for th=e previous status of a sample; used by the LIME program to restore a cancel=ed sample
ICPAES (Solid & Liquid) SAMPLE original_sample Original sample: field tying a sample be=low the CORE level to its parent HOLE sample
ICPAES (Solid & Liquid) SAMPLE parent_sample Parent sample: the sample from which thi=s sample was taken (e.g., for PWDR samples, this might be a SHLF or possibl=y another PWDR)
ICPAES (Solid & Liquid) SAMPLE standard Standard: T/F field to differentiate bet=ween samples (standard=3DF) and QAQC standards (standard=3DT)
ICPAES (Solid & Liquid) SAMPLE login_by Login by: username of account used to cr=eate the sample (can be the LIMS itself [e.g., SHLFs created when a SECT is= created])
ICPAES (Solid & Liquid) SAMPLE login_date Login date: creation date of the sample<=/td>
ICPAES (Solid & Liquid) SAMPLE legacy Legacy flag: T/F indicator for when a sa=mple is from a previous expedition and is locked/uneditable on this expedit=ion
ICPAES (Solid & Liquid) TEST test changed_on TEST changed on: date/time stamp for a c=hange to a test record.
ICPAES (Solid & Liquid) TEST test status TEST status: single-character code for t=he current status of a test (e.g., active, in process, canceled)
ICPAES (Solid & Liquid) TEST test old_status TEST old status: single-character code f=or the previous status of a test; used by the LIME program to restore a can=celed test
ICPAES (Solid & Liquid) TEST test test_number TEST test number: automatically generate=d database identifier for a test record. This is the primary key of the TES=T table.
ICPAES (Solid & Liquid) TEST test date_received TEST date received: date/time stamp for =the creation of the test record.
ICPAES (Solid & Liquid) TEST test instrument TEST instrument [instrument group]: fiel=d that describes the instrument group (most often this applies to loggers w=ith multiple sensors); often obscure (e.g., user_input)
ICPAES (Solid & Liquid) TEST test analysis TEST analysis: analysis code associated =with this test (foreign key to the ANALYSIS table)
ICPAES (Solid & Liquid) TEST test x_project TEST project: similar in scope to the ex=pedition number, the difference being that the project is the current cruis=e, whereas expedition could refer to material/results obtained on previous =cruises
ICPAES (Solid & Liquid) TEST test sample_number TEST sample number: the sample_number of= the sample to which this test record is attached; a foreign key to the SAM=PLE table
ICPAES (Solid & Liquid) CALCULATED Top depth CSF-A (m) Top depth CSF-A (m): position of observa=tion expressed relative to the top of the hole.
ICPAES (Solid & Liquid) CALCULATED Bottom depth CSF-A (m) Bottom depth CSF-A (m): position of obse=rvation expressed relative to the top of the hole.
ICPAES (Solid & Liquid) CALCULATED Top depth CSF-B (m) Top depth [other] (m): position of obser=vation expressed relative to the top of the hole. The location is presented= in a scale selected by the science party or the report user.
ICPAES (Solid & Liquid) CALCULATED Bottom depth CSF-B (m) Bottom depth [other] (m): position of ob=servation expressed relative to the top of the hole. The location is presen=ted in a scale selected by the science party or the report user.
ICPAES (Solid & Liquid) RESULT calibrated_name RESULT calibrated name: element symbol a=nd concentration unit for the element analyzed (e.g, Ba (uM), Al2O3%)
ICPAES (Solid & Liquid) RESULT concentration RESULT concentration (unit varies): conc=entration of analyte (unit to be found in calibrated name)
ICPAES (Solid & Liquid) RESULT element_name RESULT element name: full name of the el=ement analyzed (e.g., Magnesium, Boron)
ICPAES (Solid & Liquid) RESULT ssup_asman_id RESULT spreadsheet uploader ASMAN_ID: se=rial number of the ASMAN link for the spreadsheet uploader file
ICPAES (Solid & Liquid) RESULT ssup_filename RESULT spreadsheet uploader filename: fi=le name of the spreadsheet uploader file
ICPAES (Solid & Liquid) RESULT view RESULT view: axial or radial view used f=or element/wavelength pair
ICPAES (Solid & Liquid) RESULT wavelength (nm) RESULT wavelength (nm): wavelength of th=e elemental line used in this result
ICPAES (Solid & Liquid) SAMPLE sample description SAMPLE comment: contents of the SAMPLE.d=escription field, usually shown on reports as "Sample comments"
ICPAES (Solid & Liquid) TEST test test_comment TEST comment: contents of the TEST.comme=nt field, usually shown on reports as "Test comments"

ICP-OES User Guide: 29th September 2022

=LMUG-ICP_User Guide-230220-1914-156.pdf

Agilent ICP-OES 5110 User Guide (2024)
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